J. Liu, J. Hou and J. Chen, Dual-layer Feature Extraction Based Soft Sensor Methods and Applications to Industrial Polyethylene Processes, Comput. Chem. Eng., 154, 107469, 2021.
X. Wu, J. Chen, L. Xie, Y.-S. Lee, C.-I Chen and H. Su, Application of Convolutional Neural Networks for Multi-Stage Semiconductor Processes, J. Chem. Eng. Japan, 54, 449-455, 2021.
S. K. Ooi, D. Tanny, J. Chen, and K. Wang, Developing Semi-supervised Variational Autoencoder-Generative Adversarial Network Models to Enhance Quality Prediction Performance, Chemometer Intell. Lab., 217, 104385, 2021.
Y. Lyu, J. Chen, and Z. Song, Synthesizing Labeled Data to Enhance Soft Sensor Performance in Data-scarce Regions, Control Eng. Pract, 115, 104903, 2021.
L.-X. You and J. Chen, A Variable Relevant Multi-Local PCA Modeling Scheme to Monitor a Nonlinear Chemical Process, Chem. Eng. Sci., 246, 116851, 2021.
L. Zhu, Z. Li and J. Chen, Evaluating and Predicting Energy Efficiency Using Slow Feature Partial Least Squares Method for Large-scale Chemical Plants, Energy, 230, 120582, 2021.
Z. Li, Y.-S. Lee, J. Chen and Y. Qian, Variable Moving Window PLS Models for Long-term NOx Emission Prediction of Coal-fired Power Plants, Fuel, 296, 120441, 2021.
M. Ren, J. Chen, P. Shi and G. Yan, Statistical Information Based Two-Layer Model Predictive Control with Dynamic Economy and Control Performance for Non-Gaussian Stochastic Process, J. Franklin Inst., 358, 2279-2300, 2021.
Mu, T. Liu, C. Xue and J. Chen, Semi-Supervised Learning based Calibration Model Building of NIR spectroscopy for In-Situ Measurement of Biochemical Processes under Insufficiently and Inaccurately Labeled Sample, IEEE Trans. Instrum. Meas. 70, 2509912, 2021.
J. Liu, J. Chen, and D. Wang, Global-local Based Wavelet Functional Principal Component Analysis for Fault Detection and Diagnosis in Batch Processes, Chemometer Intell. Lab. 212, 104279, 2021.
J. Liu, J. Chen, and D. Wang, Linear and Exponential Fault-assistant Feature Extraction Methods for Process Monitoring, Control Eng. Pract, 109, 104732, 2021.
K. Wang, X. Yuan, J. Chen and Y. Wang Supervised and Semi-supervised Probabilistic Learning with Deep Neural Networks for Concurrent Process-Quality Monitoring, Neural Networks, 136, 54-62, 2021.
Y.-S. Lee and J. Chen, Enhancing Monitoring Performance of Data Sparse Nonlinear Processes through Information Sharing among Different Grades Using Gaussian Mixture Prior Variational Autoencoders, Chemometer Intell. Lab., 208, 104219, 2021.
Y.-S. Lee, O. S. Kit, D. Tanny and J. Chen, Maintaining Soft-Sensor Models Using Latent Dynamic Variational Autoencoders, 11th International Symposium on Advanced Control of Chemical Processes (ADCHEM), June 13-16, 2021, Venice, Italy. (Virtual)
D. Tanny and J. Chen, Developing Dynamic Soft Sensor Based Variational Autoencoders, 9th The International Symposium on Design, Operation & Control of Chemical Processes (PSE Asia 2020), Nov. 4-6, 2020, Taipei. (Virtual)
Y.-S. Lee and J. Chen, Boosting Monitoring Performance for Nonlinear Processes with Limited Samples Using Gaussian Mixture Latent Distribution in Variational Autoencoders, 9th The International Symposium on Design, Operation & Control of Chemical Processes (PSE Asia 2020), Nov. 4-6, 2020, Taipei. (Virtual)
Y.-C. Zhang, L. L. T. Chan and J. Chen, Application of Convolutional Neural Network Based Variational Auto-encoder Model to the Image Monitoring of Combustion Processes, 59th Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE), Sept. 23-26, 2020, Chiang Mai, Thailand. (Virtual)
D. Tanny, J. Chen and K. Wang, Developing Variational Autoencoders with Differential Entropy Soft Sensor Models for Nonlinear Processes, 21st IFAC World Congress, July 12-17, 2020, Berlin, Germany. (Virtual)
K. Wang, J. Chen and Y. Wang, Developing a deep learning estimator to learn nonlinear dynamic systems, 21st IFAC World Congress, July 12-17, 2020, Berlin, Germany. (Virtual)
L. Zhu, Z. Li and J. Chen, An Industrial Process Monitoring Scheme with Moving Window Slow Feature Analysis, 21st IFAC World Congress, July 12-17, 2020, Berlin, Germany. (Virtual)
Q. Chen, J. Chen, X. Lang, L. Xie, C. Jiang and H. Su, Detecting and Characterizing Nonlinearity-induced Oscillations in Process Control Loops Based on Adaptive Chirp Mode Decomposition, 2020 American Control Conference, July 1-3, 2020, Denver, CO, USA. (Virtual)
Z. Li, J. Chen and C.-I. Chen, Prognostics of Tool Failing Behavior Based on Auto-associative Gaussian Process Regression for Semiconductor Manufacturing, 2020 IEEE International Conference on Industrial Technology (ICIT) , Feb. 26-28, 2020, Buenos Aires, Argentina. (Virtual)